Analytical & Material Characterization Technologies

Our broad array of Analytical and Material Characterization technology is at your service – whether you have a big project with us or not.

Our laboratories support all of our Pre-Formulation, Material Characterization and Analytical Services. They are also available to our customers for ad-hoc services. Some of our key analytical equipment is detailed below.

CritiTech Analytical and Material Characterization Systems

JEOL NeoScope JCM-5000 Scanning Electron Microscope (SEM)

  • Compact Benchtop SEM with automated settings for biological and materials samples
  • High resolution and large depth of field complement optical microscopes or SEM instruments in the lab
  • X10 — 20,000 magnification without lens change
  • Automatic and manual control with pre-stored recipes
  • High and low vacuum modes
  • No special sample preparation, such as coating and drying, for conductive and non-conductive samples
  • Secondary electron and backscattered electron imaging
  • Three selectable accelerating voltages
  • Sample loading to imaging in less than three minutes

Quantachrome NOVATouch LX2 Surface Area Analyzer (SAA)

  • 4 Degassing Ports and 2 analysis stations
  • Surface area analysis, mesopore size distribution, and standard micropore analysis.

Malvern MasterSizer 3000 Particle Size Analyzer (PSA)

  • Aero S, Hydro MV, and Hydro SV dispersion units.
  • 0.01-3500 um range
  • 21CFR Part 211 Compliant